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CGS701AV 数据表(PDF) 2 Page - National Semiconductor (TI) |
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CGS701AV 数据表(HTML) 2 Page - National Semiconductor (TI) |
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2 / 10 page ![]() CGS701A General Description (Continued) CLK1SEL pin changes the output frequency of the CLK1 0 thru CLK1 5 outputs During normal operation when CLK1SEL pin is high these outputs are at the same frequency as the input crystal oscillator while CLK2 and CLK4 outputs are at twice and four times the input frequen- cy respectively Once CLK1SEL pin is set to a low logic level the CLK1 outputs will be at twice the input frequency the same as the CLK2 output with CLK4 output still being at four times the input frequency In addition another pin is added for increasing the test ca- pability SKWSEL pin allows testing of the counter’s output and skew of the output drivers by bypassing the VCO In this test mode CLK4 frequency is the same as SKWTST input frequency while CLK2 is 12 and CLK1 frequencies are 14 respectively (refer to the Truth Table) In addition CLK1SEL functionality is also true under this test condition Block Diagram TLF11920 – 2 http www nationalcom 2 |
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