These conditions apply unless otherwise specified: T

−30dBm (Note 6),(Note 7).

Symbol

Parameter

Conditions

Typ

(Note 3)

Limit

(Note 4)

Units

Input/Output Characteristics:

output resistance

Differential

5K

Ω

output capacitance

Differential

0.5

pF

Logic I/O

clock speed

Maximum

1

MHz

data to clock setup

time, T

CS

Minimum

50

nsec

data to clock hold

time, T

CH

Minimum

10

nsec

clock pulse width high,

T

CWH

Minimum

50

nsec

clock pulse width low,

T

CWL

Minimum

50

nsec

clock to load enable

setup time, T

ES

Minimum

50

nsec

high level input

voltage

0.7 V

CCD

V

low level input voltage

0.3 V

CCD

V

High level input

current

µA

low level input current

µA

high level output

voltage

Isource = 0.5mA

V

V

low level output

voltage

Isink = 0.5mA

0.4

V

DC Characteristics:

Supply current

75

95

mA

Supply current in

power down mode

35

100

µA

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is in-

tended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.

Note 2: Human body model, 1.5k

Ω in series with 100pF. Machine model, 200Ω in series with 100pF.

Note 3: Typical values represent the most likely parametric norm.

Note 4: All limits are guaranteed by testing or statistical analysis, unless otherwise noted.

Note 5: AC test performed at 400MHz unless otherwise noted.

Note 6: Refer to test circuit schematic, loss of transformers is excluded from the measurement.

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