bq20z95

SLUS757C – JULY 2007 – REVISED OCTOBER 2013

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TERMINAL FUNCTIONS (continued)

TERMINAL

DESCRIPTION

NO.

NAME

Cell voltage sense input and cell balancing input for the positive voltage of the second lowest cell in

40

VC3

IA, P

cell stack and the negative voltage of the second highest cell in 4-series cell applications.

Cell voltage sense input and cell balancing input for the positive voltage of the second highest cell

41

VC2

IA, P

and the negative voltage of the highest cell in 4 cell applications. Connect to VC3 in 2-cell stack

applications.

Cell voltage sense input and cell balancing input for the positive voltage of the highest cell in cell

42

VC1

IA, P

stack in 4-cell applications. Connect to VC2 in 3- or 2-series cell applications.

43

BAT

I, P

Battery stack voltage sense input

44

CHG

O

High side N-chan charge FET gate drive

ABSOLUTE MAXIMUM RATINGS

Over Operating Free-Air Temperature (unless otherwise noted)

(1)

DESCRIPTION

PIN

UNIT

VBAT, VCC

–0.3 V to 34 V

PACK, PMS

–0.3 V to 34 V

Supply voltage range

VC(n)-VC(n+1); n = 1, 2, 3, 4

–0.3 V to 8.5 V

VC1, VC2, VC3, VC4

–0.3 V to 34 V

VC5

–0.3 V to 1 V

PFIN, SMBD, SMBC, LED1, LED2,

–0.3 V to 6 V

LED3, LED4, LED5, DISP

TS1, TS2, SAFE, VCELL+, PRES;

Input voltage range

ALERT

MRST, GSRN, GSRP, RBI

ASRN, ASRP

–1 V to 1 V

DSG, CHG, GPOD

–0.3 V to 34 V

ZVCHG

Output voltage range

TOUT, ALERT, REG33

–0.3 V to 6 V

RESET

–0.3 V to 7 V

REG25

–0.3 V to 2.75 V

PRES, PFIN, SMBD, SMBC, LED5,

Maximum combined sink current for input pins

50 mA

LED4, LED3, LED2, LED1

Operating free-air temperature range

–40°C to 85°C

Functional temperature

–40°C to 100°C

Storage temperature range

–65°C to 150°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

4

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