COmpOnent-level test

perfOrmed

spaCe prOtOtype (O)

Class h

Qml

Class k

Qml

Element Electrical

yes

no

yes

yes

yes

yes

Element Visual

no

no

yes

yes

yes

yes

Internal Visual

no

N/A

yes

N/A

yes

N/A

Temperature Cycling

no

no

no

no

yes

yes

Constant Acceleration

no

no

no

no

yes

yes

Interim Electrical

no

N/A

no

N/A

yes

N/A

Burn-in

no

N/A

no

N/A

yes

N/A

Post Burn-in Electrical

no

N/A

no

N/A

yes

N/A

Steady State Life

no

N/A

no

N/A

yes

N/A

Voltage Conditioning Aging

N/A

no

N/A

no

N/A

yes

Visual Inspection

no

no

N/A

no

N/A

yes

Final Electrical

no

no

yes

yes

yes

yes

no

no

yes

yes

yes

yes

SEM

no

N/A

no

N/A

yes

N/A

SLAM™/C-SAM:

Input capacitors only

(Add’l test, not req. by H or K)

no

no

no

yes

no

yes

Notes:

1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.

2. M/S = Active components (Microcircuit and Semiconductor Die)

3. P = Passive components

4. Not applicable to EMI filters that have no wirebonds.

Definitions:

Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534

SEM: Scanning Electron Microscopy

SLAM™: Scanning Laser Acoustic Microscopy

C-SAM: C - Mode Scanning Acoustic Microscopy

Crane Aerospace & Electronics Power Solutions

STF28-461 EMI Input Filters

Page 8 of 10

RevA-20070509

28 VOlT INPuT – 0.8 aMP

www.craneae.com