LM26LVCISDX-085SLASHNOPB datasheet(4/33 Pages) TI1

4 / 33 page

Example: 2 to 3

Battery Cells

VDD Supply

(+1.6V to +5.5V)

GND

VDD

OVERTEMP

VTEMP

TRIP TEST

Microcontroller

LM26LV

Analog

ADC Input

LM26LV

SNIS144F – JULY 2007 – REVISED FEBRUARY 2013

www.ti.com

Typical Application

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

Supply Voltage

−0.3V to +6.0V

Voltage at OVERTEMP pin

−0.3V to +6.0V

Voltage at OVERTEMP and VTEMP pins

−0.3V to (VDD + 0.5V)

TRIP TEST Input Voltage

−0.3V to (VDD + 0.5V)

Output Current, any output pin

±7 mA

Input Current at any pin(2)

5 mA

Storage Temperature

−65°C to +150°C

Maximum Junction Temperature, TJ(MAX)

+155°C

Human Body Model

4500V

ESD Susceptibility(3)

Machine Model

300V

Charged Device Model

1000V

For soldering specifications: see product folder at www.ti.com and http://www.ti.com/lit/SNOA549

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see

the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics

may degrade when the device is not operated under the listed test conditions.

(2)

When the input voltage (VI) at any pin exceeds power supplies (VI < GND or VI > VDD), the current at that pin should be limited to 5mA.

(3)

The Human Body Model (HBM) is a 100pF capacitor charged to the specified voltage then discharged through a 1.5k

Ω resistor into

each pin. The Machine Model (MM) is a 200pF capacitor charged to the specified voltage then discharged directly into each pin. The

Charged Device Model (CDM) is a specified circuit characterizing an ESD event that occurs when a device acquires charge through

some triboelectric (frictional) or electrostatic induction processes and then abruptly touches a grounded object or surface.

Operating Ratings

(1)

Specified Temperature Range:

TMIN ≤ TA ≤ TMAX

LM26LV/LM26LV-Q1

−50°C ≤ TA ≤ +150°C

Supply Voltage Range (VDD)

+1.6 V to +5.5 V

Thermal Resistance (

θJA)

(2)

WSON-6 (Package NGF0006A)

152 °C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see

the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics

may degrade when the device is not operated under the listed test conditions.

(2)

The junction to ambient temperature resistance (

θJA) is specified without a heat sink in still air.

Submit Documentation Feedback

Product Folder Links: LM26LV

LM26LVCISDX-085/NOPB 数据表(PDF) 4 Page - Texas Instruments

LM26LVCISDX-085/NOPB 数据表(HTML) 4 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33

数据表下载