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VNH3SP30 数据表(PDF) 9 Page - STMicroelectronics

部件名 VNH3SP30
功能描述  FULLY INTEGRATED H-BRIDGE MOTOR DRIVER
PDF  26 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

VNH3SP30 数据表(HTML) 9 Page - STMicroelectronics

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VNH3SP30
TEST MODE
The PWM pin allows to test the load connection between two half-bridges. In the test mode (Vpwm=-2V)
the internal Power Mos gate drivers are disabled. The INA or INB inputs allow to turn-on the High Side A
or B, respectively, in order to connect one side of the load at VCC voltage. The check of the voltage on
the other side of the load allow to verify the continuity of the load connection. In case of load
disconnection the DIADX/ENX pin corresponding to the faulty output is pulled down.
ELECTRICAL TRANSIENT REQUIREMENTS
ISO T/R
7637/1
Test Pulse
Test Level
I
Test Level
II
Test Level
III
Test Level
IV
Test Levels
Delays and Impedance
1
-25V
-50V
-75V
-100V
2ms, 10
2
+25V
+50V
+75V
+100V
0.2ms, 10
3a
-25V
-50V
-100V
-150V
0.1
µs, 50Ω
3b
+25V
+50V
+75V
+100V
0.1
µs, 50Ω
4
-4V
-5V
-6V
-7V
100ms, 0.01
5
+26.5V
+46.5V
+66.5V
+86.5V
400ms, 2
ISO T/R
7637/1
Test Pulse
Test Levels Result
I
Test Levels Result
II
Test Levels Result
III
Test Levels Result
IV
1
CC
C
C
2
CC
C
C
3a
CC
C
C
3b
CC
C
C
4
CC
C
C
5
CE
E
E
Class
Contents
C
All functions of the device are performed as designed after exposure to disturbance.
E
One or more functions of the device are not performed as designed after exposure to disturbance
and cannot be returned to proper operation without replacing the device.
1



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