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DAC6571IDBVT 数据表(PDF) 8 Page - Texas Instruments |
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DAC6571IDBVT 数据表(HTML) 8 Page - Texas Instruments |
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8 / 22 page ![]() www.ti.com CLK (5V/div) V OUT (1V/div) Time (1 µs/div) Full−Scale Code Change 00 H to 3FFH Output Loaded with 2 K Ω and 200pF to GND 0 V LOGIC (V) 1 2 3 4 5 2500 2000 1500 1000 500 0 Time CLK (5V/div) V OUT (1V/div) 1023 to 0 Output Loaded with 2 kW and 200 pF to GND Full−Scale Code Change 1 ms/div Time (1 µs/div) CLK (5V/div) V OUT (1V/div) Half−Scale Code Change Output Loaded with 2k Ω and 200pF to GND 256 to 768 (1 µs /div) C LK (5 V /div) V O U T (1 V /d iv ) H alf−S ca le C o de C ha nge O utpu t Lo ad ed w ith 2k Ω and 200pF to GND 768 to 256 Time Time (20 µs/div) Loaded with 2k Ω to V DD. V DD (1V/div) V OUT (1V/div) DAC6571 SLAS406 – DECEMBER 2003 TYPICAL CHARACTERISTICS: VDD = +5 V (continued) At T A = +25°C, +VDD = +5 V, unless otherwise noted. SUPPLY CURRENT vs LOGIC INPUT VOLTAGE FULL-SCALE SETTLING TIME Figure 13. Figure 14. FULL-SCALE SETTLING TIME HALF-SCALE SETTLING TIME Figure 15. Figure 16. HALF-SCALE SETTLING TIME POWER-ON RESET TO 0V Figure 17. Figure 18. 8 |
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