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ACST8 数据表(PDF) 6 Page - STMicroelectronics |
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ACST8 数据表(HTML) 6 Page - STMicroelectronics |
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6 / 10 page ![]() ACST8 6/10 Figure 8: Relative variation of thermal impedance versus pulse duration (TO-220AB / D2PAK) Figure 9: On-state characteristics (maximum values) Figure 10: Surge peak on-state current versus number of cycles Figure 11: Non repetitive surge peak on-state current for a sinusoidal pulse with width tp < 10ms, and corresponding value of I2t Figure 12: Relative variation of gate trigger current, holding current and latching current versus junction temperature (typical values) Figure 13: Relative variation of critical rate of decrease of main current versus reapplied dV/ dt (typical values) 1.E-02 1.E-01 1.E+00 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 TO-220AB/D PAK 2 K=[Z /R ] th th t (°C) p Zth(j-c) Zth(j-a) 1 10 100 01 234 56 Tj=25°C Tj=125°C Tj max. : Vto = 0.95 V Rd = 50 m Ω I (A) out t (°C) p 0 10 20 30 40 50 60 70 80 90 1 10 100 1000 Non repetitive Tj initial=25°C Repetitive Tc=90°C t=20ms I (A) TSM Number of cycles 10 100 1000 0.01 0.10 1.00 10.00 I (A), I t (A s) TSM 22 t (ms) p T initial=25°C j ITSM I t 2 dI/dt limitation: 100A/µs 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100 110 120 130 IGT & IH IL I, , [T , GT I I /I I , I [T =25°C] HL jGT H L j T (°C) j 0 1 2 3 4 5 0.1 1.0 10.0 100.0 (dI/dt)c[(dV/dt)c] / Specified (dI/dt)c dV/dt(V/µs) |
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