PCI Express 3.0

The N5393D includes support for testing

PCI Express 3.0 devices. The tests

supported include new jitter, voltage,

de-emphasis, preshoot, pseudo S21 loss

and others defined by the PCI Express

3.0 BASE specification. In addition, with

the addition of the optional InfiniiSim

Waveform Transformation Toolset, the

N5393D also integrates de-embedding

of test channel and cable losses with

user-supplied S-parameters for fixtures

and connectors. De-embedding is used to

recover jitter losses due to the attenuation

of high frequency elements caused by the

test channel.

Figure 4. PCI Express 3.0 transmitter tests.

Figure 5. The N5393D integrates de-embedding capability when coupled with the optional

InfiniiSim waveform transformation toolset.

Select PCI Express

Transmitter tests to test

your new PCIe 3.0 device.