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©2016 Integrated Device Technology, Inc

April 5, 2016

831742I Data Sheet

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is

mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium

has been reached under these conditions.

NOTE 1: Measured from the differential input cross point to the differential output crossing point.

NOTE 2: Measurement taken from differential waveform.

NOTE 3: Measurement from -150mV to +150mV on the differential waveform (derived from QX minus nQX). The signal must be monotonic

through the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.

NOTE 5: Measurement taken from single-ended waveform.

NOTE 6: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.

NOTE 7: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.

NOTE 8: Measured at crossing point where the instantaneous voltage value of the rising edge of QX equals the falling edge of nQX.

See Parameter Measurement Information Section

NOTE 9: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing

points for this measurement. See Parameter Measurement Information Section.

NOTE 10: Defined as the total variation of all crossing voltage of rising QX and falling nQX. This is the maximum allowed variance in the

NOTE 11: Input duty cycle must be 50%.

NOTE 12: Matching applies to rising edge rate for QX and falling edge rate for nQX. It is measured using a ±75mV window centered on the

median crosspoint where QX meets nQX falling. The median crosspoint is used to calculate the voltage thresholds the oscilloscope is to use

for the edge rate calculations. The rise edge rate of QX should be compared to the fall edge rate of nQX, the maximum allowed difference

should not exceed 20% of the slowest edge rate.

NOTE 13: Defined as skew between input paths on the same device, using the same input signal levels, measured at one specific output at the

differential cross points.

NOTE 14: This parameter is defined in accordance with JEDEC Standard 65.

NOTE 15: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions. Using

the same type of inputs on each device, the outputs are measured at the differential cross points.

NOTE 16: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential cross

points.

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

Output Frequency

700

MHz

Propagation Delay; NOTE 1

1.5

2

2.5

ns

tsk(o)

Output Skew; NOTE 16

Across All Outputs

3

15

ps

tsk(i)

Input Skew; NOTE 13

Any Input to Q/nQ

30

110

ps

tsk(pp)

Part-to-Part Skew; NOTE 14, 15

225

ps

Mux Isolation

f = 100MHz

40

dB

Rising

Edge Rate

Rising Edge Rate; NOTE 2, 3

f = 100MHz

0.6

4

V/ns

Falling

Edge Rate

Falling Edge Rate; NOTE 2, 3

f = 100MHz

0.6

4

V/ns

Ringback Voltage; NOTE 2, 4

f = 100MHz

-100

100

mV

Absolute Max Output Voltage;

NOTE 5, 6

f = 100MHz

1150

mV

Absolute Min Output Voltage;

NOTE 5, 7

f = 100MHz

-300

mV

Absolute Crossing Voltage;

NOTE 5, 8, 9

f = 100MHz

250

550

mV

V

CROSS

edges; NOTE 5, 8, 10

f = 100MHz

140

mV

odc

Output Duty Cycle; NOTE 11

f

 200MHz

48

50

52

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