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©2016 Integrated Device Technology, Inc

Revision B June 28, 2016

831752 Data Sheet

NOTE: Measurements taken with Q output and FCLK output.

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is

mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium

has been reached under these conditions.

NOTE: All measurements were taken with FCLK, nFCLK and Q, nQ operating as outputs unless otherwise noted.

NOTE 1: Measured from the differential input cross point to the differential output crossing point.

NOTE 2: Measurement taken from differential waveform.

NOTE 3: Measurement from -150mV to +150mV on the differential waveform (derived from Q minus nQ). The signal must be monotonic

through the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.

NOTE 5: Measurement taken from single-ended waveform.

NOTE 6: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.

NOTE 7: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.

NOTE 8: Measured at crossing point where the instantaneous voltage value of the rising edge of Q equals the falling edge of nQ.

See Parameter Measurement Information Section.

NOTE 9: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing

points for this measurement. See Parameter Measurement Information Section.

for any particular system. See Parameter Measurement Information Section.

NOTE 11: Input duty cycle must be 50%.

NOTE 12: Matching applies to rising edge rate for Q and falling edge rate for nQ. It is measured using a ±75mV window centered on the

median crosspoint where Q meets nQ falling. The median crosspoint is used to calculate the voltage thresholds the oscilloscope is to use for

the edge rate calculations. The rise edge rate of Q should be compared to the fall edge rate of nQ, the maximum allowed difference should not

exceed 20% of the slowest edge rate.

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

Output Frequency

100

500

MHz

tjit

Buffer Additive Phase Jitter, RMS;

refer to Additive Phase Jitter Plot

100MHz, Integration Range:

12kHz – 20MHz

0.3

0.505

ps

Propagation Delay, NOTE 1

FCLK to Q

1.75

3.65

ns

CLK to Q

1.95

3.90

ns

CLK to FCLK

1.50

3.70

ns

Mux Isolation

f = 100MHz

-70

dB

Edge Rate

Rise/Fall Edge Rate; NOTE 2, 3

0.6

4

V/ns

Ringback Voltage; NOTE 2, 4

-100

100

mV

NOTE 2, 4

500

ps

Absolute Max Output Voltage;

NOTE 5, 6

800

1350

mV

Absolute Min Output Voltage;

NOTE 5, 7

-300

-35

mV

Absolute Crossing Voltage;

NOTE 5, 8, 9

250

385

650

mV

V

CROSS

edges; NOTE 5, 8, 10

40

140

mV

odc

Output Duty Cycle; NOTE 11

f

312.5MHz

44

50

56

%

f > 312.5MHz

40

50

60