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STM32F303RE 数据表(PDF) 143 Page - STMicroelectronics |
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STM32F303RE 数据表(HTML) 143 Page - STMicroelectronics |
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143 / 173 page  DocID026415 Rev 5 143/173 STM32F303xD STM32F303xE Electrical characteristics 151 Figure 50. ADC accuracy characteristics Table 85. ADC accuracy at 1MSPS(1)(2) Symbol Parameter Test conditions Typ Max(3) Unit ET Total unadjusted error ADC Freq ≤ 72 MHz Sampling Freq ≤ 1MSPS 2.4 V ≤ VDDA = VREF+ ≤ 3.6 V Single-ended mode Fast channel ±2.5 ±5 LSB Slow channel ±3.5 ±5 EO Offset error Fast channel ±1 ±2.5 Slow channel ±1.5 ±2.5 EG Gain error Fast channel ±2 ±3 Slow channel ±3 ±4 ED Differential linearity error Fast channel ±0.7 ±2 Slow channel ±0.7 ±2 EL Integral linearity error Fast channel ±1 ±3 Slow channel ±1.2 ±3 1. ADC DC accuracy values are measured after internal calibration. 2. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative current. Any positive injection current within the limits specified for IINJ(PIN) and ∑IINJ(PIN) in Section 6.3.15: I/O port characteristics does not affect the ADC accuracy. 3. Data based on characterization results, not tested in production. |
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