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HCPL4100 数据表(PDF) 7 Page - Agilent(Hewlett-Packard) |
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HCPL4100 数据表(HTML) 7 Page - Agilent(Hewlett-Packard) |
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7 / 12 page  7 Notes: 1. Derate linearly above 55 °C free air temperature at a rate of 3.8 mW/ °C. Proper application of the derating factors will prevent IC junction temperatures from exceeding 125 °C for ambient temperatures up to 85 °C. 2. Derate linearly above a free-air temperature of 70 °C at a rate of 2.3 mW/ °C. A significant amount of power may be dissipated in the HCPL-4100 output circuit during the transition from the SPACE state to the MARK state when driving a data line or capacitive load (C OUT). The average power dissipation during the transition can be estimated from the following equation which assumes a linear discharge of a capacitive load: P = ISC (VSO + VMO)/2, where VSO is the output voltage in the SPACE state. The duration of this transition can be estimated as t = C OUT (VSO - VMO)/ISC. For typical applications driving twisted pair data lines with NRZ data as shown in Figure 11, the transition time will be less than 10% of one bit time. 3. Derate linearly above 55 °C free-air temperature at a rate of 5.1 mW/ °C. 4. The maximum current that will flow into the output in the mark state (I SC) is internally limited to protect the device. The duration of the output short circuit shall not exceed 10 ms. 5. The device is considered a two terminal device, pins 1, 2, 3, and 4 are connected together, and pins 5, 6, 7, and 8 are connected together. 6. The t PLH propagation delay is measured from the 1.3 volt level on the leading edge of the input pulse to the 10 mA level on the leading edge of the output pulse. 7. The t PHL propagation delay is measured from the 1.3 volt level on the trailing edge of the input pulse to the 10 mA level on the trailing edge of the output pulse. 8. The rise time, t r, is measured from the 10% to the 90% level on the rising edge of the output current pulse. 9. The fall time, t f, is measured from the 90% to the 10% level on the falling edge of the output current pulse. 10. Common mode transient immunity in the logic high level is the maximum (positive) dVCM/dt on the leading edge of the common mode pulse, VCM, that can be sustained with the output in a Mark ("H") state (i.e., IO > 12 mA). 11. Common mode transient immunity in the logic low level is the maximum (positive) dVCM/dt on the leading edge of the common mode pulse, VCM, that can be sustained with the output in a Space ("L") state (i.e., IO < 3 mA). 12. Use of a 0.1 µF bypass capacitor connected between pins 5 and 8 is recommended. 13. In accordance with UL 1577, each optocoupler is momentary withstand proof tested by applying an insulation test voltage ≥ 3000 V rms for 1 second (leakage detection current limit, Ii-o ≤ 5 µA). Figure 2. Typical Mark State Output Voltage vs. Temperature. Figure 3. Typical Output Voltage vs. Loop Current. Figure 4. Typical Space State Output Current vs. Temperature. -40 1.6 1.2 TA – TEMPERATURE – °C 060 1.8 1.4 -20 20 40 2.0 2.2 2.4 2.6 2.8 3.0 80 100 IO 20 mA 12 mA 2 mA VCC = 5 V VI = 2 V 0 1.0 0 IO – OUTPUT CURRENT – mA 10 20 1.5 0.5 515 2.0 2.5 3.0 3.5 25 30 VCC = 5 V VI = 2 V TA = 25 °C -40 0.8 0.6 TA – TEMPERATURE – °C 060 0.9 0.7 -20 20 40 1.0 1.1 1.2 1.3 80 100 VO 27 V 20 V VCC = 5 V VI = 0.8 V |
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