 2015-2016 Microchip Technology Inc.

DS60001371C-Page 17

IS1870/71

3.0

ELECTRICAL CHARACTERISTICS

This section provides an overview of the IS1870/71 electrical characteristics. Additional information will be provided

in future revisions of this document.

Absolute maximum ratings for the IS1870/71 devices are listed below. Exposure to the maximum rating conditions for

extended periods may affect device reliability. Functional operation of the device at these or any other conditions, above

the parameters indicated in the operation listings of this specification, is not implied.

Absolute Maximum Ratings

(See Note 1)

Ambient temperature under bias...............................................................................................................-20°C to +70°C

Storage temperature .............................................................................................................................. -40°C to +125°C

Maximum output current sunk by any I/O pin..........................................................................................................12 mA

Maximum output current sourced by any I/O pin....................................................................................................12 mA

ESD (according to machine model, JEDEC EIA/JESD22-A115-C)

Maximum output for all pins, excluding RF Tx pin .................................................................................................±200V

Maximum output for all pins ....................................................................................................................................±150V

Maximum output (human-body model)........................................................................................................................±2V

Maximum output (charge-device model).................................................................................................................±150V

Note 1:

Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions,

above those indicated in the operation listings of this specification, is not implied. Exposure to maximum

rating conditions for extended periods may affect device reliability.

IS1870SF_IS1871SF.book Page 17 Thursday, March 31, 2016 10:29 AM