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LM45 数据表(PDF) 2 Page - National Semiconductor (TI) |
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LM45 数据表(HTML) 2 Page - National Semiconductor (TI) |
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2 / 9 page ![]() Absolute Maximum Ratings (Note 1) Supply Voltage +12V to −0.2V Output Voltage +V S + 0.6V to −1.0V Output Current 10 mA Storage Temperature −65˚C to +150˚C Lead Temperature: SOT Package (Note 2): Vapor Phase (60 seconds) 215˚C Infrared (15 seconds) 220˚C ESD Susceptibility (Note 3): Human Body Model Machine Model 2000V 250V Operating Ratings (Note 1) Specified Temperature Range (Note 4) T MIN to TMAX LM45B, LM45C −20˚C to +100˚C Operating Temperature Range LM45B, LM45C −40˚C to +125˚C Supply Voltage Range (+V S) +4.0V to +10V Electrical Characteristics Unless otherwise noted, these specifications apply for +V S = +5Vdc and ILOAD = +50 µA, in the circuit of Figure 2. These specifications also apply from +2.5˚C to T MAX in the circuit of Figure 1 for +VS = +5Vdc. Boldface limits apply for TA = T J = T MIN to TMAX ; all other limits TA = TJ = +25˚C, unless otherwise noted. Parameter Conditions LM45B LM45C Units (Limit) Typical Limit Typical Limit (Note 5) (Note 5) Accuracy T A=+25˚C ±2.0 ±3.0 ˚C (max) (Note 6) T A=TMAX ±3.0 ±4.0 ˚C (max) T A=TMIN ±3.0 ±4.0 ˚C (max) Nonlinearity T MIN≤TA≤TMAX ±0.8 ±0.8 ˚C (max) (Note 7) Sensor Gain T MIN≤TA≤TMAX +9.7 +9.7 mV/˚C (min) (Average Slope) +10.3 +10.3 mV/˚C (max) Load Regulation (Note 8) 0 ≤I L≤ +1 mA ±35 ±35 mV/mA (max) Line Regulation +4.0V ≤+V S≤+10V ±0.80 ±0.80 mV/V (max) (Note 8) ±1.2 ±1.2 mV/V (max) Quiescent Current +4.0V ≤+V S≤+10V, +25˚C 120 120 µA (max) (Note 9) +4.0V ≤+V S≤+10V 160 160 µA (max) Change of Quiescent 4.0V ≤+V S≤10V 2.0 2.0 µA (max) Current (Note 9) Temperature Coefficient +2.0 +2.0 µA/˚C of Quiescent Current Minimum Temperature In circuit of +2.5 +2.5 ˚C (min) for Rated Accuracy Figure 1,I L=0 Long Term Stability (Note 10) T J=TMAX, for 1000 hours ±0.12 ±0.12 ˚C Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its rated operating conditions. Note 2: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in a current National Semicon- ductor Linear Data Book for other methods of soldering surface mount devices. Note 3: Human body model, 100 pF discharged through a 1.5 k Ω resistor. Machine model, 200 pF discharged directly into each pin. Note 4: Thermal resistance of the SOT-23 package is 260˚C/W, junction to ambient when attached to a printed circuit board with 2 oz. foil as shown in Figure 3. Note 5: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 6: Accuracy is defined as the error between the output voltage and 10 mv/˚C times the device’s case temperature, at specified conditions of voltage, current, and temperature (expressed in ˚C). Note 7: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature range. Note 8: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be com- puted by multiplying the internal dissipation by the thermal resistance. Note 9: Quiescent current is measured using the circuit of Figure 1. Note 10: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. www.national.com 2 |
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