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LM60 数据表(PDF) 4 Page - National Semiconductor (TI) |
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LM60 数据表(HTML) 4 Page - National Semiconductor (TI) |
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4 / 9 page ![]() Electrical Characteristics (Continued) Note 10: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. Note 11: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate. Typical Performance Characteristics To generate these curves the LM60 was mounted to a printed circuit board as shown in Figure 2. Thermal Resistance Junction to Air Thermal Time Constant Thermal Response in Still Air with Heat Sink 01268103 01268104 01268105 Thermal Response in Stirred Oil Bath with Heat Sink Start-Up Voltage vs. Temperature Thermal Response in Still Air without a Heat Sink 01268106 01268107 01268108 Quiescent Current vs. Temperature Accuracy vs Temperature Noise Voltage 01268109 01268110 01268111 www.national.com 4 |
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