WM8955L

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Product Preview Rev 0.4 May2003

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ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device maybe caused bycontinuously

operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given

under Electrical Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore genericallysusceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Supplyvoltages

-0.3V

+3.63V

Voltage range digital inputs

DGND -0.3V

DBVDD +0.3V

Voltage range analogue inputs

AGND -0.3V

AVDD +0.3V

-25

°C+85°C

Storage temperature prior to soldering

30

°C max / 85% RH max

Storage temperature after soldering

-65

°C

+150

°C

Package bodytemperature (soldering 10 seconds)

+260

°C

Package bodytemperature (soldering 2 minutes)

+183

°C

Notes

1.

Analogue and digital grounds must always be within 0.3V of each other.

2.

All digital and analogue supplies are completelyindependent from each other.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Digital supplyrange (Core)

DCVDD

1.42

2.0

3.6

V

Digital supplyrange (Buffer)

DBVDD

1.8

2.0

3.6

V

Analogue supplies range

AVDD, HPVDD

1.8

2.0

3.6

V

Ground

DGND, AGND, HPGND

0

V