ESDALC6V1P6

6/10

®

2. Crosstalk behavior

The crosstalk phenomena are due to the coupling between 2 lines. Coupling factors (

β12 or β21 ) increase

when the gap across lines decreases, particularly in silicon dice. In the example above, the expected

phenomenon has to be taken into account when the drivers impose fast digital data or high frequency

analog signals. The perturbed line will be more affected if it works with low voltage signal or high load

impedance (few k

Ω).

Figure A7 gives the measurement circuit for the analog crosstalk application. In figure 8, the curve shows

the effect of the cell I/O1 on the cell I/O4. In usual frequency range of analog signals (up to 100 MHz) the

effect on disturbed line is less than -55dB.

Fig. A6: Crosstalk phenomenon.

Fig. A7: Analog crosstalk test configuration.

Fig. A8: Typical analog crosstalk response.

αβ

1G1

12G2

V+

V

αβ

2G2

21G1

V+

V

Line 1

Line 2

DRIVERS

RECEIVERS

GND

I/O1

I/O4

unloaded

50

Ω

50

Ω

Port 1

Port 2

100.0k

1.0M

10.0M

100.0M

1.0G

-100.00

-90.00

-80.00

-70.00

-60.00

-50.00

-40.00

-30.00

-20.00

-10.00

0.00

dB

f/Hz