Si4356

Rev 1.2

5

200 kHz Selectivity3

Desired Ref Signal 3 dB above sensitiv-

ity, BER < 0.1%. Interferer is CW and

desired modulated with

2.4 kbps

F = 30 kHz (G)FSK,

BT = 0.5,

Rx BW = 155 kHz,

—–42

—

dB

400 kHz Selectivity3

—–50

—

dB

Blocking 1 MHz Offset3

—

Desired Ref Signal 3 dB above sensitiv-

ity, BER < 0.1% Interferer is CW and

desired modulated with 2.4 kbps

F = 30 kHz (G)FSK, BT = 0.5,

RX BW = 155 kHz

—–57

—

dB

Blocking 8 MHz Offset3

——

–68

—

dB

Image Rejection3

IF = 468 kHz

—

–35

—

dB

Spurious Emissions3

Measured at RX pins

—

—

–54

dBm

Table 4. Auxiliary Block Specifications1

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

——

—

10

—

pF

XTAL Frequency

—

—

—

30

—

MHz

XTAL Series Resistance

—

—

—

—

50



XTAL Stability

—

—

—

±50

—

ppm

Reset to RX Time2

——

—

20

ms

Notes:

1.

Test conditions and max limits are listed in section in “1.1. Definition of Test Conditions”.

2.

Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" subsection of

section “1.1. Definition of Test Conditions”.

3.

Targeted nominal capacitive load for both XIN and XOUT pins.

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Notes:

1.

Test conditions and max limits are listed in section “1.1. Definition of Test Conditions”.

2.

Sensitivity measured at 434 MHz using a PN9 modulated input signal. Received signal is filtered, deglitched, and

retimed using an external RC filter (R = 1

k

3.

Guaranteed by qualification. Qualification test conditions are listed in section “1.1. Definition of Test Conditions”.