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4356-RX-434 数据表(PDF) 8 Page - Silicon Laboratories |
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4356-RX-434 数据表(HTML) 8 Page - Silicon Laboratories |
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8 / 26 page ![]() Si4356 8 Rev 1.2 1.1. Definition of Test Conditions Production Test Conditions: TA =+25 °C VDD =+3.3VDC External reference signal (XIN) = 1.0 VPP at 30 MHz, centered around 0.8 VDC Production test schematic (unless noted otherwise) All RF input levels referred to the pins of the Si4356 (not the RF module) Qualification Test Conditions: TA = –40 to +85 °C (typical = 25 °C) VDD = +1.8 to +3.6 VDC (typical = 3.3 VDC) Using reference design or production test schematic All RF input levels are referred to the antenna port of Si4356 reference design or to the pins of the Si4356 when the production test setup is used. |
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