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LRI64 数据表(PDF) 25 Page - STMicroelectronics |
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LRI64 数据表(HTML) 25 Page - STMicroelectronics |
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25 / 38 page ![]() 25/38 LRI64 MAXIMUM RATING Stressing the device above the rating listed in the Absolute Maximum Ratings table may cause per- manent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not im- plied. Exposure to Absolute Maximum Rating con- ditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality docu- ments. Table 11. Absolute Maximum Ratings Note: 1. Mil. Std. 883 - Method 3015 2. ESD test: ISO10373-7 specification Symbol Parameter Min. Max. Unit TSTG, hSTG, tSTG Storage Conditions Wafer 15 25 °C 23 months kept in its antistatic bag A1, A6, A7 15 25 °C 40% 60% RH 2 years ICC Supply Current on AC0 / AC1 –20 20 mA VMAX Input Voltage on AC0 / AC1 –7 7 V VESD Electrostatic Discharge Voltage 1 A1, A6, A7 –7000 7000 V |
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