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S3A3 数据表(PDF) 49 Page - Renesas Technology Corp |
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S3A3 数据表(HTML) 49 Page - Renesas Technology Corp |
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49 / 139 page  R01DS0307EU0100 Rev.1.00 Page 49 of 139 Mar 7, 2017 S3A3 2. Electrical Characteristics Figure 2.17 Voltage dependency in high-speed mode (reference data) Figure 2.18 Voltage dependency in middle-speed mode (reference data) 0 10 20 30 40 50 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VCC (V) Ta = 25 , ICLK = 48 MHz *1 Ta = 105 , ICLK = 48 MHz *2 Ta = 25 , ICLK = 32 MHz *1 Ta = 105 , ICLK = 32 MHz *2 Ta = 25 , ICLK = 16 MHz *1 Ta = 105 , ICLK = 16 MHz *2 Ta = 25 , ICLK = 8 MHz *1 Ta = 105 , ICLK = 8 MHz *2 Ta = 25 , ICLK = 4 MHz *1 Ta = 105 , ICLK = 4 MHz *2 Ta = 105 , ICLK = 48 MHz*2 Ta = 25 , ICLK = 48 MHz*1 Ta = 105 , ICLK = 32 MHz*2 Ta = 105 , ICLK = 16 MHz*2 Ta = 105 , ICLK = 8 MHz*2 Ta = 105 , ICLK = 4 MHz*2 Ta = 25 , ICLK = 32 MHz*1 Ta = 25 , ICLK = 16 MHz*1 Ta = 25 , ICLK = 8 MHz*1 Ta = 25 , ICLK = 4 MHz*1 Note 1. All peripheral operations except any BGO operation are operating normally. This is the average of the actual measurements of the sample cores during product evaluation. Note 2. All peripheral operations except any BGO operation are operating at maximum. This is the average of the actual measurements for the upper-limit samples during product evaluation. 0 5 10 15 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VCC (V) Ta = 25 , ICLK = 12 MHz *1 Ta = 105 , ICLK = 12 MHz *2 Ta = 25 , ICLK = 8 MHz *1 Ta = 105 , ICLK = 8 MHz *2 Ta = 25 , ICLK = 4 MHz *1 Ta = 105 , ICLK = 4 MHz *2 Ta = 25 , ICLK = 1 MHz *1 Ta = 105 , ICLK = 1 MHz *2 Ta = 105 , ICLK = 12 MHz*2 Ta = 105 , ICLK = 1 MHz *2 Ta = 105 , ICLK = 8 MHz *2 Ta = 105 , ICLK = 4 MHz *2 Ta = 25 , ICLK = 12 MHz*1 Ta = 25 , ICLK = 4 MHz *1 Ta = 25 , ICLK = 1 MHz *1 Ta = 25 , ICLK = 8 MHz *1 Note 1. All peripheral operations except any BGO operation are operating normally. This is the average of the actual measurements of the sample cores during product evaluation. Note 2. All peripheral operations except any BGO operation are operating at maximum. This is the average of the actual measurements for the upper-limit samples during product evaluation. |
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