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USB97CFDC 数据表(PDF) 9 Page - SMSC Corporation |
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USB97CFDC 数据表(HTML) 9 Page - SMSC Corporation |
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9 / 20 page ![]() SMSC DS – USB97CFDC Page 9 Rev. 12/15/2000 PIN NO. NAME SYMBOL BUFFER TYPE DESCRIPTION MISCELLANEOUS 17 Crystal Input/External Clock Input XTAL1/ CLKIN ICLKx 14.318Mhz Crystal or clock input. This pin can be connected to one terminal of the crystal or can be connected to an external 14.318Mhz clock when a crystal is not used. 18 Crystal Output XTAL2 OCLKx 14.318Mhz Crystal This is the other terminal of the crystal, or left open when an external clock source is used to drive XTAL1/CLKIN. It may not be used to drive any external circuitry other than the crystal circuit. 23 SRAM Enable nMEMEN O24 An active low signal is output on this pin to enable the optional external SRAM for extended FDC write and read caching for ultra high performance applications. 24 Option Enable OPTEN I Current firmware utilizes this input pin for detecting the media density switch of the drive. Various firmware options are available for different polarities of this signal. Contact factory for available firmware options. If this pin is not driven by the drive, it should be tied low. 25 Drive Ready nDRVRDY I An active low signal on this pin from the floppy disk drive, after DS0 goes active, indicates that the system may activate MTR0. If the drive does not supply this signal, this pin should be tied low. 26 Drive Power nFDPWR OD24 This active low signal is intended to activate an external power switch, either in the drive or on the system board, to supply power to the floppy disk drive. It is active whenever the USB97CFDC is not in SUSPEND mode. 21 RESET input nRESET IS This active low signal is used by the system to reset the chip. The active low pulse should be at least 100ns wide. 22 Test output TSTOUT O8 This signal is used for testing the chip via an internal XNOR chain. User should normally leave it unconnected. 15 Test input nTEST I This signal is a manufacturing test pin. It should be tied to VDD for normal operation. 16 Test Enable nTESTEN I This active low signal places the device into board test mode using the XNOR chain. For normal operation this pin should be tied high. See Board Test Mode Operation on page 10 POWER, GROUND, AND NO CONNECTS 14, 39, 60, 82, 93 VDD +3.3V power 8, 19, 27, 43, 52, 66, 79, 81, 88 GND Ground Reference 20, 51, 78, 80, 83, 94-96 NC No Connect. These pins should not be connected externally. |
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