| 制造商 | 部件名 | 数据表 | 功能描述 |
 NXP Semiconductors |
TDA4565
|
77Kb / 11P |
Colour transient improvement circuit
November 1989 |
|
TDA4560
|
67Kb / 9P |
Colour transient improvement circuit
March 1985 |
 Texas Instruments |
SWRA370
|
601Kb / 34P |
Basic RF Testing of CCxxxx Devices
|
 Polyfet RF Devices |
P282
|
43Kb / 2P |
polyfet rf devices
|
 STMicroelectronics |
AN2025
|
154Kb / 11P |
Converter Improvement Using
REV. 1 |
|
AN975
|
78Kb / 11P |
As part of a process of continuous improvement
|
|
AN2719
|
242Kb / 22P |
Precision improvement techniques
28-Oct-2008 |
 Littelfuse |
MG12105S-BA1MM
|
1Mb / 6P |
High Ruggedness
|
 Advanced Semiconductor |
HVV0405-1000
|
353Kb / 3P |
Excellent Ruggedness
|
|
HVV1011-1000L
|
376Kb / 3P |
Excellent Ruggedness
|