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AN1232 数据表(PDF) 2 Page - STMicroelectronics

部件名 AN1232
功能描述  Ruggedness improvement of RF DMOS devices
PDF  6 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

AN1232 数据表(HTML) 2 Page - STMicroelectronics

  AN1232 Datasheet HTML 1Page - STMicroelectronics AN1232 Datasheet HTML 2Page - STMicroelectronics AN1232 Datasheet HTML 3Page - STMicroelectronics AN1232 Datasheet HTML 4Page - STMicroelectronics AN1232 Datasheet HTML 5Page - STMicroelectronics AN1232 Datasheet HTML 6Page - STMicroelectronics  
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Proposed model
AN1232
2/6
1
Proposed model
Figure 1.
Npn Bipolar parasitic transistor
Under impedance mismatch conditions the RF power transistor is subjected to a reflected
wave with an amplitude that cannot be controlled and, in the worse case, with a voltage
value that can exceed the BVdss of the device itself. Hence, the DMOS works as a voltage
clamp for this wave. Under such conditions the device is subjected to an electric current
whose amplitude is proportional to the power of the incident wave. Simultaneously, the
DMOS experiences a temperature rise proportional to the duration, voltage swing (BVdss)
and amplitude of the above current. In the DMOS cross section, shown in Figure 1, the
presence of an npn bipolar parasitic transistor, in which the base and emitter are shorted by
means of the DMOS source metallization, are clearly noticeable.
Under static conditions the parasitic transistor is inhibited by the short circuit, but under
dynamic conditions, when the reverse breakdown current flows through the device, the short
circuit condition itself is modified. In fact, this current crosses the base-emitter junction
through the base resistance which is increased by the depletion layer due to the reverse
voltage. This results in a variation in Vbe.
We can assume that:
Equation 1
If Idis (base distributed current) and Rbe (base distributed resistance) are large enough, the
potential on the emitter side opposed to the short circuit is sufficient to turn on the bipolar
transistor, thus concentrating the current and destroying the device.
A simplified model was developed (see Figure 2) to simulate the mismatch condition on the
drain of the DMOS by means of the inductance L.
V
be
R
be
I
dis
•
=



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