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TSB41BA3IPFP 数据表(PDF) 16 Page - Texas Instruments |
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TSB41BA3IPFP 数据表(HTML) 16 Page - Texas Instruments |
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16 / 63 page  TSB41BA3 IEEE 1394b THREEPORT CABLE TRANSCEIVER/ARBITER SLLS155A − MAY 2003 − REVISED OCTOBER 2003 16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended ranges of operating conditions (unless otherwise noted) (continued) thermal characteristics PARAMETER TEST CONDITION MIN TYP MAX UNIT RθJA Junction-to-free-air thermal resistance Board mounted, No air flow, High conductivity TI recommended test board, chip soldered or greased to 19.04 °C/W RθJC Junction-to-case-thermal resistance recommended test board, chip soldered or greased to thermal land with 2 oz. copper 0.17 °C/W RθJA Junction-to-free-air thermal resistance Board mounted, No air flow, High conductivity TI recommended test board with thermal land but no solder 31.52 °C/W RθJC Junction-to-case-thermal resistance recommended test board with thermal land but no solder or grease thermal connection to thermal land with 2 oz. copper 0.17 °C/W RθJA Junction-to-free-air thermal resistance Board mounted, No air flow, High conductivity JEDEC 49.17 °C/W RθJC Junction-to-case-thermal resistance Board mounted, No air flow, High conductivity JEDEC test board with 1 oz. copper 3.11 °C/W switching characteristics PARAMETER TEST CONDITION MIN TYP MAX UNIT tr TP differential rise time, transmit 10% to 90%, At 1394 connector 0.3 0.8 ns tf TP differential fall time, transmit 90% to 10%, At 1394 connector 0.3 0.8 ns tsu Setup time, CTL0, CTL1, D1−D7, LREQ to PCLK 1394a-2000 50% to 50%, See Figure 2 2.5 ns th Hold time, CTL0, CTL1, D1−D7, LREQ after PCLK 1394a-2000 50% to 50%, See Figure 2 0 ns tsu Setup time, CTL0, CTL1, D1−D7, LREQ to LCLK_PMC 1394b 50% to 50%, See Figure 2 2.5 ns th Hold time, CTL0, CTL1, D1−D7, LREQ after LCLK_PMC 1394b 50% to 50%, See Figure 2 0 ns td Delay time, PCLK to CTL0, CTL1, D1−D7, PINT 1394a-2000 and 1394b 50% to 50%, See Figure 3 0.5 7 ns PARAMETER MEASUREMENT INFORMATION TPAx+ TPBx+ TPAx− TPBx− 56 Ω Figure 1. Test Load Diagram |
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