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Page 3 of 15

Issue A

ML145053

LANSDALE Semiconductor, Inc.

A/D CONVERTER ELECTRICAL CHARACTERISTICS

(Full Temperature and Voltage Ranges per Operation Ranges Table)

Characteristic

Definition and Test Conditions

Guaranteed

Limit

Unit

Resolution

Number of bits resolved by the A/D converter

10

Bits

Maximum Nonlinearity

Maximum difference between an ideal and an actual ADC transfer function

±

1

LSB

Maximum Zero Error

Difference between the maximum input voltage of an ideal and an actual

ADC for zero output code

±

1

LSB

Maximum Full-Scale Error

Difference between the minimum input voltage of an ideal and an actual

ADC for full-scale output code

±

1

LSB

Maximum Total Unadjusted Error

Maximum sum of nonlinearity, zero error, and full-scale error

±

1

LSB

Maximum Quantization Error

Uncertainty due to converter resolution

±

1/2

LSB

Absolute Accuracy

Difference between the actual input voltage and the full-scale weighted

equivalent of the binary output code, all error sources included

±

1-1/2

LSB

Maximum Conversion Time

Total time to perform a single analog-to-digital conversion

44

µ

s

Data Transfer Time

Total time to transfer digital serial data into and out of the device

10 to 16

SCLK

cycles

Sample Acquisition Time

Analog input acquisition time window

6

SCLK

cycles

Minimum Total Cycle Time

Total time to transfer serial data, sample the analog input, and perform the

conversion; SCLK = 2.1 MHz

49

µ

s

Maximum Sample Rate

Rate at which analog inputs may be sampled; SCLK = 2.1 MHz

20.4

ks/s