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AD5246BKS100-R2 数据表(PDF) 10 Page - Analog Devices |
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AD5246BKS100-R2 数据表(HTML) 10 Page - Analog Devices |
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10 / 20 page ![]() AD5246 TEST CIRCUITS Figure 20 to define the test conditions used in the product Specification tables. Figure 24 IW VMS W B DUT Figure 20. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) ∆VMS% DD% PSS (%/%) = V+= VDD 10% PSRR (dB) = 20 LOG DUT MS DD ( ) VDD VMS W B V+ ∆V ∆V ∆V Figure 21. Test Circuit for Power Supply Sensitivity (PSS, PSSR) W 10k Ω 10k Ω 2.5V B +15V –15V VOUT OP27 DUT VIN Figure 22. Test Circuit for Gain vs. Frequency W B VDD TO GND DUT ISW CODE = 0x00 RSW = 0.1V ISW 0.1V Figure 23. Test Circuit for Incremental ON Resistance W B NO CONNECT ICM VCM DUT Figure 24. Test Circuit for Common-Mode Leakage Current Rev. 0 | Page 10 of 20 |
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