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74FCT16952CTPVG 数据表(PDF) 4 Page - Integrated Device Technology |
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74FCT16952CTPVG 数据表(HTML) 4 Page - Integrated Device Technology |
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4 / 7 page ![]() 4 INDUSTRIALTEMPERATURERANGE IDT74FCT16952AT/CT/ET FASTCMOS16-BITREGISTEREDTRANSCEIVER Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit ΔICC Quiescent Power Supply VCC = Max. — 0.5 1.5 mA Current TTL Inputs HIGH VIN = 3.4V(3) ICCD Dynamic Power Supply Current(4) VCC = Max., VIN = VCC — 75 120 µA/ OutputsOpen VIN = GND MHz xOEAB = xOEBA = GND OneInputToggling 50% Duty Cycle IC Total Power Supply Current(6) VCC = Max., Outputs Open VIN = VCC — 0.8 1.7 mA fCP = 10MHz (xCLKAB) VIN = GND 50% Duty Cycle xOEAB = xCEAB = GND xOEBA = VCC VIN = 3.4V — 1.3 3.2 fi = 5MHz VIN = GND 50% Duty Cycle OneBitToggling VCC = Max., Outputs Open VIN = VCC — 3.8 6.5(5) fCP = 10MHz (xCLKAB) VIN = GND 50% Duty Cycle xOEAB = xCEAB = GND xOEBA = VCC VIN = 3.4V — 8.3 20(5) fi = 2.5MHz VIN = GND 50% Duty Cycle SixteenBitsToggling POWER SU PPLY CH ARACT ERI ST I CS NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fCPNCP/2 + fiNi) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fCP fi = Input Frequency Ni = Number of Inputs at fi |
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