数据搜索系统,热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

GD9FS1G8F2AMG 数据表(PDF) 12 Page - GigaDevice Semiconductor (Beijing) Inc.

部件名 GD9FS1G8F2AMG
功能描述  Single level cell technology
PDF  55 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  GIGADEVICE [GigaDevice Semiconductor (Beijing) Inc.]
网页  http://www.gigadevice.com/
标志 GIGADEVICE - GigaDevice Semiconductor (Beijing) Inc.

GD9FS1G8F2AMG 数据表(HTML) 12 Page - GigaDevice Semiconductor (Beijing) Inc.

Back Button GD9FS1G8F2AMG Datasheet HTML 8Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 9Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 10Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 11Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 12Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 13Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 14Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 15Page - GigaDevice Semiconductor (Beijing) Inc. GD9FS1G8F2AMG Datasheet HTML 16Page - GigaDevice Semiconductor (Beijing) Inc. Next Button
Zoom Inzoom in Zoom Outzoom out
 12 / 55 page
background image
GD9Fx1GxF2A
12
5.3.2. Host Requirements
The host shall not erase or program blocks marked as defective by the manufacturer, and any attempt to do so yields
indeterminate results.
Figure of “Flow chart to create initial invalid block table” outlines the flow chart how to create an initial invalid block table. It
should be performed by the host to create the initial bad block table prior to performing any erase or programming
operations on the target. The 1st byte of both main and spare region in non
‐defective blocks are read FFh with ECC
enabled on the controller. A defective block is indicated by the majority of bits being read non
‐FFh in the Defective Block
Marking location of either the first page or last page of the block. The host shall check the Defective Block Marking location
of both the first and last past page of each block to verify the block is valid prior to any erase or program operations on that
block.
NOTE: Over the lifetime use of a NAND device, the Defective Block Marking of defective blocks may encounter read
disturbs that cause bit changes. The initial defect marks by the manufacturer may change value over the lifetime of the
device, and are expected to be read by the host and used to create a bad block table during initial use of the part.
Start
Accessing the 1st block
Check FFh at
1st byte of both main and spare data
of the first page
Check FFh at
1st byte of both main and spare data
of the last page
Last Block
End
Yes
Update a Bad Block table
Yes
No
No
Accessing next block
No
Figure 8: flow chart to create initial invalid block table sequential figures



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com