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PUSB3F96 数据表(PDF) 4 Page - Nexperia B.V. All rights reserved |
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PUSB3F96 数据表(HTML) 4 Page - Nexperia B.V. All rights reserved |
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4 / 16 page ![]() PUSB3F96 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product data sheet Rev. 3 — 29 September 2014 3 of 15 NXP Semiconductors PUSB3F96 ESD protection for ultra high-speed interfaces 6. Characteristics [1] This parameter is guaranteed by design. [2] According to IEC 61000-4-5 (8/20 s current waveform). [3] 100 ns Transmission Line Pulse (TLP); 50 ; pulser at 80 ns. Table 5. Characteristics Tamb =25 C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit VBR breakdown voltage II = 1 mA 6 --V ILR reverse leakage current per channel; VI = 3 V --1 A VF forward voltage II = 1 mA -0.7 -V Cline line capacitance f = 1 MHz; VI =3.3 V [1] -0.5 0.6 pF C line line capacitance difference f= 1MHz; VI =3.3 V [1] -0.05 -pF rdyn dynamic resistance surge [2] positive transient - 0.41 - negative transient - 0.26 - TLP [3] positive transient - 0.43 - negative transient - 0.28 - VCL clamping voltage IPP =5.2 A [2] positive transient - 4.6 - V IPP = 4.4 A [2] negative transient - 2.2 - V |
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