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STM32MP151AAB3 数据表(PDF) 160 Page - STMicroelectronics

部件名 STM32MP151AAB3
功能描述  Arm® Cortex®-A7 800 MHz Cortex®-M4 MPU, TFT, 35 comm. interfaces, 25 timers, adv. analog
PDF  253 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32MP151AAB3 数据表(HTML) 160 Page - STMicroelectronics

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Electrical characteristics
STM32MP151A/D
160/253
DS12500 Rev 3
6.3.16
I/O current injection characteristics
As a general rule, a current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3.3 V-capable I/O pins) should be avoided during the normal
product operation. However, in order to give an indication of the robustness of the device in
cases when an abnormal injection accidentally happens, susceptibility tests are performed
on a sample basis during the device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset, oscillator frequency
deviation).
The following tables are the compilation of the SIC1/SIC2 and functional ESD results.
Negative induced A negative induced leakage current is caused by negative injection and
positive induced leakage current by positive injection.
6.3.17
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 50: I/O static characteristics are
derived from tests performed under the conditions summarized in Table 13: General
operating conditions. All I/Os are CMOS and TTL compliant.
Table 48. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latchup class
TA = +25 °C conforming to JESD78
II level A
Table 49. I/O current injection susceptibility(1)
Symbol
Description
Negative
injection
Positive
injection
Unit
IINJ
ANA0, ANA1, PA4, PA5
0
0
mA
PG2, PG3, PG4, PH2
0
N/A
All other FTxx I/Os
5
N/A
1. Guaranteed by characterization
.



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