Final Datasheet

21

Rev. 1.0

2018-04-04

TLE5014

Specification

3.4

EEPROM Memory

The sensor includes a non-volatile memory (NVM) where calibration data and sensor configuration data are

stored. The customer has access to a part of this memory for storage of application specific data (e.g. look-up

table & customer ID)

The time for programming the customer relevant part of the NVM as well as maximum cycles of programming

and data retention is given in Table 3-13

3.5

Reset Concept and Fault Monitoring

Some internal and external faults of the device can trigger a reset. During this reset, all output pins are high-

ohmic to avoid any disturbance of other sensors which may be connected together in a bus mode. A reset is

indicated as soon as the sensor is back at operational mode either by a status bit (SPC and SENT protocol) or

with a duty cycle in the diagnostic range (PWM interface). In the case of a periodic reset (sensor toggles

between on and off state) it is avoided that the output toggles with a frequency close to a valid PWM

frequency. In this way it is ensured, that a reset can clearly be distinguished from a valid output signal.

3.6

External & Internal Faults

In case of an occurrence of external or internal faults, as for example overvoltage or undervoltage, the sensor

reacts in a way that these faults are indicated to the customer. This can be either by a status bit (SPC and SENT

protocol) or with a duty cycle in the diagnostic range (PWM interface).

The error signaling (safe state) is defined as:

• indication of an error (e.g. status bit)

• detectable wrong output (e.g. CRC failure)

• no output

All errors are indicated as long as they persist, but at least once. After disappearance of the error, the error

indication is also cleared. The error is signaled and communicated to the ECU latest after 5ms from occurrence

of the fault. To achieve this, it has to be ensured that the protocol transmission time is not exceeding 1ms.

Otherwise, the fault tolerant time interval is increased above 5ms.

5) Hysteresis is the maximum difference of the angle value for forward and backward rotation

Table 3-13 EEPROM

Parameter

Symbol

Values

Unit

Note /

Test Condition

Number

Min.

Typ.

Max.

Number of possible NVM

programming cycles

100

-

NVM data retention

-

21

a

includes 19a

lifetime and 2a

storage

Time for programming of

whole NVM (customer

relevant part)

0.5

s

incl. look-up

table,

configuration,

customer ID;

with 100kbit/s