Data Sheet

ADRF5045

Rev. A | Page 13 of 14

PROBE MATRIX BOARD

The probe matrix board is a 4-layer board that uses a 12 mil

Rogers RO4003 as the top dielectric material. The external

copper layer is 0.7 mil and the internal copper layers are

1.4 mil. The RF transmission lines were designed using

a CPWG model, with a 16 mil width and a ground spacing of

6 mil, to have a characteristic impedance of 50 Ω.

Figure 26 shows the cross sectional view of the probe matrix

board and Figure 27 shows the top view of the probe matrix

board. Measurements were made using 535 µm GSG probes at

close proximity to the RFx pins. Unlike the ADRF5045-EVALZ,

probing reduces reflections caused by mismatch arising from

connectors, cables, and board layout, resulting in a more

accurate measurement of the performance of the ADRF5045.

RO4003

FR4

FR4

1oz Cu (1.4mil)

1oz Cu (1.4mil)

0.5oz Cu (0.7mil)

0.5oz Cu (0.7mil)

0.5oz Cu (0.7mil)

0.5 oz Cu (0.7mil)

W = 16mil

G = 6mil

T = 0.7mil

H = 12mil

Figure 26. Probe Matrix Board (Cross Sectional View)

Figure 27. Probe Board Layout (Top View)

RF traces for a through reflect line (TRL) calibration are

designed on the board itself. A nonzero line length compensates

for board loss at calibration. The actual board duplicates the

same layout in matrix form to assemble multiple devices at

once. Insertion loss and input and output return losses were

measured on this probe matrix board. Isolation performance

measured on the probe matrix board is limited due to signal

coupling between the RF probes that are in close proximity.

Therefore, RF port to port isolation was measured on the

ADRF5045-EVALZ.