ISO7741FDW datasheet(31/52 Pages) TI

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Time = 2.5 ns / div

ISO7740, ISO7741, ISO7742

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SLLSEP4G – MARCH 2016 – REVISED FEBRUARY 2020

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10.2.3 Application Curve

The following typical eye diagrams of the ISO774x family of devices indicates low jitter and wide open eye at the

maximum data rate of 100 Mbps.

Figure 24. Eye Diagram at 100 Mbps PRBS 216 – 1, 5 V and

25°C

Figure 25. Eye Diagram at 100 Mbps PRBS 216 – 1, 3.3 V

and 25°C

Figure 26. Eye Diagram at 100 Mbps PRBS 216 – 1, 2.5 V and 25°C

10.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Figure 27 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced

insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million

(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation

voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for

lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%

higher than the specified value.

Figure 28 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.

Based on the TDDB data, the insulation withstand capability of DW-16 package is 1500 VRMS with a lifetime of

135 years as illustrated in Figure 28. Similarly, the insulation withstand capability of DWW-16 package is 2000

VRMS with a corresponding lifetime of 34 years. DBQ-16 package at 400 VRMS working voltage has a much longer

lifetime than both DW-16 and DWW-16 packages. Factors, such as package size, pollution degree, and material

group can limit the working voltage of a component.

ISO7741FDW 数据表(PDF) 31 Page - Texas Instruments