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FXLS8967AFR3 数据表(PDF) 72 Page - NXP Semiconductors

部件名 FXLS8967AFR3
功能描述  3-Axis Low-g Accelerometer
PDF  98 Pages
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制造商  NXP [NXP Semiconductors]
网页  http://www.nxp.com
标志 NXP - NXP Semiconductors

FXLS8967AFR3 数据表(HTML) 72 Page - NXP Semiconductors

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NXP Semiconductors
FXLS8967AF
3-Axis Low-g Accelerometer
Field
Description
1
Z_WT_EF
Z-axis data or delta inside of upper and lower thresholds event flag; This flag is only valid if Z_WT_EN
= 1:
0: Z-axis data or delta is ≥
SDCD_UTHS value or ≤ SDCD_LTHS value.
1: Z-axis data or delta is <
SDCD_UTHS and > SDCD_LTHS value.
Notes:
• The SDCD_CONFIG1[WT_ELE] bit determines the behavior of this bit. If WT_ELE = 1, the flag
is latched when WT_EA goes high, and remains set until it is cleared by reading the
SDCD_
INT_SRC2 register. If the host wishes to know the state of this event flag, it must be read prior to
reading the
SDCD_INT_SRC2 register.
• If WT_ELE = 0, the X/Y/Z_WT_EF flags are updated if WT_EA = 1 and the SDCD_WT_DBCNT
value is reached. If WT_ELE = 0, the X/Y/Z_WT_EF flags are updated even if WT_EA = 0 when the
SDCD_WT_DBCNT value is set to 0.
Table 99. SDCD_INT_SRC2 register (address 2Eh) bit description...continued
15.31.3 SDCD_CONFIG1 register (address 2Fh)
Bit
7
6
5
4
3
2
1
0
Name
OT_ELE WT_ELE X_OT_EN Y_OT_EN Z_OT_EN X_WT_EN Y_WT_EN Z_WT_EN
Reset (BT_MODE = GND)
0
0
0
0
0
0
0
0
Reset (BT_MODE = VDD)
0
0
1
1
1
0
0
0
Access
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
Table 100. SDCD_CONFIG1 register (address 2Fh) bit allocation
Field
Description
7
OT_ELE
SDCD outside-of-thresholds event latch
0 (default): Outside of thresholds event flag latching is disabled.
1: Outside of thresholds event flag latching is enabled.
With outside-of-thresholds event latching enabled, the X/Y/Z_OT_EF flags can only be cleared
by reading the
SDCD_INT_SRC1 register. When OT_ELE is set, the outside-of-thresholds event
condition (OT_EA) flag is only asserted when the event condition transitions from False to True. For
example, once the OT_EA flag is set, the event condition must become False before a subsequent
True event is recognized. With outside-of-thresholds event latching disabled, the X/Y/Z_OT_EF flags
are updated in real time and may be cleared by the function prior to the host system reading
SDCD_
INT_SRC1 if the event condition becomes false before the read occurs.
6
WT_ELE
SDCD within-thresholds event latch
0 (default): Within thresholds event flag latching is disabled.
1: Within thresholds event flag latching is enabled.
With within-thresholds event latching enabled, the X/Y/Z_WT_EF flags can only be cleared by reading
the
SDCD_INT_SRC2 register. When within-thresholds event latching is disabled, the X/Y/Z_WT_EF
flags are updated in real time and may be cleared by the function prior to the host system reading
the
SDCD_INT_SRC2 register, if the event condition becomes false before the read occurs. When
WT_ELE is set, the within-thresholds event condition (WT_EA) flag is only asserted when the event
condition transitions from False to True. For example, once the WT_EA flag is set, the event condition
must become False before a subsequent True event will be recognized
5
X_OT_EN
SDCD function X-axis outside-of-thresholds condition
0: X-axis data or delta is not used in the outside of thresholds condition evaluation.
1: X-axis data or delta is used in the outside of thresholds condition evaluation.
Table 101. SDCD_CONFIG1 register (address 2Fh) bit description
FXLS8967AF
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
Objective data sheet
Rev. 1 — 27 April 2021
72 / 98



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