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STP45N60DM6 数据表(PDF) 4 Page - STMicroelectronics |
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STP45N60DM6 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 15 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 30 A ISDM,(1) Source-drain current (pulsed) - 95 A VSD (2) Forward on voltage VGS = 0 V, ISD = 30 A - 1.6 V trr Reverse recovery time ISD = 30 A, di/dt = 100 A/µs, VDD = 60 V (see )Figure 17. Test circuit for inductive load switching and diode recovery times - 110 ns Qrr Reverse recovery charge - 0.5 µC IRRM Reverse recovery current - 9 A trr Reverse recovery time ISD = 30 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see )Figure 17. Test circuit for inductive load switching and diode recovery times - 215 ns Qrr Reverse recovery charge - 2 µC IRRM Reverse recovery current - 17 A 1. Pulse width is limited by safe operating area 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5% STP45N60DM6, STW45N60DM6 Electrical characteristics DS11664 - Rev 3 page 4/15 |
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