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STTH30M06S 数据表(PDF) 5 Page - STMicroelectronics |
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STTH30M06S 数据表(HTML) 5 Page - STMicroelectronics |
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5 / 10 page ![]() Figure 7. Reverse recovery charges versus dIF/dt (typical values) 0 100 200 300 400 500 0 50 100 150 200 250 300 350 400 450 500 QRR(nC) dIF/dt(A/µs) V R = 400 V T j = 125 °C I F = IF(AV) Figure 8. Reverse recovery softness factor versus dIF/dt (typical values) 0.0 0.2 0.4 0.6 0.8 0 50 100 150 200 250 300 350 400 450 500 dIF/dt(A/µs) SFACTOR IF = I F(AV) VR=400V Tj=125°C Figure 9. Relative variations of dynamic parameters versus junction temperature 0.0 0.4 0.8 1.2 1.6 2.0 25 50 75 100 125 Tj(°C) IF=IF(AV) VR=400 V Reference: Tj=125 °C IRM SFACTOR QRR Figure 10. Junction capacitance versus reverse voltage applied (typical values) 10 100 1 10 100 1000 C(pF) F = 1 MHz V osc= 30 mVRMS T j = 25 °C VR(V) Figure 11. Relative variation of non-repetitive peak surge forward current versus pulse duration (sinusoidal waveform) 1.0 1.5 2.0 2.5 3.0 3.5 4.0 0.1 1.0 10.0 IFSM(tp) / IFSM(10ms) tp(ms) Figure 12. Relative variation of non-repetitive peak surge forward current versus initial junction temperature (sinusoidal waveform) IFSM(Tj) / IFSM(25 °C) Tj(°C) 0.0 0.2 0.4 0.6 0.8 1.0 1.2 25 50 75 100 125 150 175 STTH30M06S Characteristics (curves) DS13736 - Rev 2 page 5/10 |
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