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STF6N60DM2 数据表(PDF) 4 Page - STMicroelectronics |
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STF6N60DM2 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 12 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 5 A ISDM (1) Source-drain current (pulsed) - 20 A VSD (2) Forward on voltage VGS = 0 V, ISD = 5 A - 1.6 V trr Reverse recovery time ISD = 5 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 60 ns Qrr Reverse recovery charge - 135 nC IRRM Reverse recovery current - 4.5 A trr Reverse recovery time ISD = 5 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 132 ns Qrr Reverse recovery charge - 429 nC IRRM Reverse recovery current - 6.5 A 1. Pulse width is limited by safe operating area. 2. Pulse test: pulse duration = 300 µs, duty cycle 1.5%. STF6N60DM2 Electrical characteristics DS12220 - Rev 3 page 4/12 |
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