3

IXDN430 / IXDI430 / IXDD430 / IXDS430

Unless otherwise noted, T

o

C, 8.5V

≤ V

All voltage measurements with respect to GND. IXDD430 configured as described in Test Conditions.

Electrical Characteristics

S ym bol

Param eter

T est C onditio n s

M in

T yp

M ax

U nits

High input v oltage

4.5V

3.5

V

Low input v oltage

4.5V

0.8

V

Input v oltage range

-5

V

Input current

0V

-10

10

µA

High output v oltage

V

Low output v oltage

0.025

V

O utput resistance

@ O utput high

0.3

0.4

Ω

O utput resistance

@ O utput Low

0.2

0.3

Ω

Peak output current

30

A

Continuous output

current

Lim ited by package power

dissipation

8

A

Enable v oltage range

IXD D430 O nly

- 0.3

Vcc + 0.3

V

High E n Input V oltage

IXD D430 O nly

2/3 V cc

V

Low En Input V oltage

IXD D430 O nly

1/3 V cc

V

EN Input R esistance

IXD S430 O nly

400

K ohm

INV Voltage Range

IXD S430 O nly

- 0.3

Vcc + 0.3

V

High IN V Input Voltage

IXD S430 O nly

2/3 V cc

V

Low IN V Input V oltage

IXD S430 O nly

1/3 V cc

V

INV Input R esistance

IXD S430 O nly

400

K ohm

Rise tim e

18

20

ns

Fall tim e

16

18

ns

O n-tim e propagation

delay

41

45

ns

Off-tim e propagation

delay

35

39

ns

Enable to output high

delay tim e

IXD D430 O nly, Vcc=18V

47

ns

Disable to output low

delay tim e

IXD D430 O nly, Vcc=18V

120

ns

Power supply v oltage

8.5

18

35

V

Power supply current

1

0

3

10

10

mA

µA

µA

Parameter

Value

Supply Voltage

40 V

All Other Pins

-0.3 V to VCC + 0.3 V

TO220 (CI), TO263 (YI)

2W

Derating Factors (to Ambient)

TO220 (CI), TO263 (YI)

0.016W/oC

Storage Temperature

-65 oC to 150 oC

Lead Temperature (10 sec)

300 oC

Operating Ratings

P aram eter

V alue

M axim um Junction Tem perature

150 oC

O perating Tem perature R ange

-55 oC to 125 oC

Therm al Im pedance TO 220 (C I), TO 263 (Y I)

0.95 oC/W

62.5 oC/W

Therm al Im pedance 28 pin S O IC with H eat S lug (S I)

3 oC/W

Specifications Subject To Change Without Notice

Note 1: Operating the device beyond parameters with listed “absolute maximum ratings” may cause permanent

damage to the device. Typical values indicate conditions for which the device is intended to be functional, but do not

guarantee specific performance limits. The guaranteed specifications apply only for the test conditions listed.

Exposure to absolute maximum rated conditions for extended periods may affect device reliability.