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M95640-R 数据表(PDF) 36 Page - STMicroelectronics |
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M95640-R 数据表(HTML) 36 Page - STMicroelectronics |
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36 / 53 page ![]() DC and AC parameters M95640-W M95640-R M95640-DF 36/53 DocID16877 Rev 19 Table 16. DC characteristics (M95640-R, device grade 6) Symbol Parameter Test conditions in addition to those defined in Table 11(1) Min. Max. Unit ILI Input leakage current VIN = VSS or VCC -± 2 µA ILO Output leakage current S = VCC, voltage applied on Q = VSS or VCC -± 2 µA ICC Supply current (Read) VCC = 1.8 V, C = 0.1 VCC or 0.9 VCC, at 2 MHz, Q = open -2 mA VCC = 1.8 V, C = 0.1 VCC or 0.9 VCC, at 5 MHz, Q = open -2(2) ICC0(3) Supply current (Write) VCC = 1.8 V, during tW, S = VCC -5 mA ICC1 Supply current (Standby) VCC = 1.8 V, S = VCC, VIN = VSS or VCC -1 µA VIL Input low voltage 1.8 V ≤VCC < 2.5 V –0.45 0.25 VCC V VIH Input high voltage 1.8 V ≤VCC < 2.5 V 0.75 VCC VCC+1 V VOL Output low voltage IOL = 0.15 mA, VCC = 1.8 V - 0.3 V VOH Output high voltage IOH = –0.1 mA, VCC = 1.8 V 0.8 VCC -V 1. If the application uses the M95640-R device at 2.5 V < VCC< 5.5 V and -40 °C < TA < +85 °C, please refer to Table 15: DC characteristics (M95640-W, device grade 6), rather than to the above table. 2. Only for M95640 devices identified by process letter K. 3. Characterized only, not tested in production. |
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