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PUSB3AB2DF 数据表(PDF) 6 Page - Nexperia B.V. All rights reserved |
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PUSB3AB2DF 数据表(HTML) 6 Page - Nexperia B.V. All rights reserved |
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6 / 11 page ![]() Nexperia PUSB3AB2DF Extremely low clamping low capacitance ESD protection reverse dI dV Vhold Ihold It1 Vt1 V I forward aaa-027670 VRWM Rdyn = dV/dI Fig. 9. V-I characteristics for a bidirectional ESD protection diode 10. Application information The device is designed for the protection of two signal lines from surge pulses and ESD damage. The device is suitable on lines where the signal polarities are both, positive and negative with respect to ground. The device uses an advanced clamping structure showing a negative dynamic resistance. This snap-back behavior strongly reduces the clamping voltage system behind the ESD protection during an ESD event. Do not connect unlimited DC current sources to the data lines to avoid keeping the ESD protection device snap-back state after exceeding breakdown voltage (due to an ESD pulse for instance). aaa-030287 ESD protection diode GND lines to be protected Fig. 10. Application diagram Circuit board layout and protection device placement Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT) and surge transients. The following guidelines are recommended: 1. Place the device as close to the input terminal or connector as possible. 2. Minimize the path length between the device and the protected line. 3. Keep parallel signal paths to a minimum. 4. Avoid running protected conductors in parallel with unprotected conductors. 5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and ground loops. 6. Minimize the length of the transient return path to ground. 7. Avoid using shared transient return paths to a common ground point. 8. Use ground planes whenever possible. For multilayer PCBs, use ground vias. PUSB3AB2DF All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2019. All rights reserved Product data sheet 22 November 2019 6 / 11 |
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