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AD8332ACP-R2 数据表(PDF) 20 Page - Analog Devices

部件名 AD8332ACP-R2
功能描述  Ultralow Noise VGAs with Preamplifier and Programmable RIN
PDF  40 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

AD8332ACP-R2 数据表(HTML) 20 Page - Analog Devices

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AD8331/AD8332/AD8334
Rev. E | Page 20 of 40
TEST CIRCUITS
MEASUREMENT CONSIDERATIONS
Figure 55 through Figure 68 show typical measurement
configurations and proper interface values for measurements
with 50 Ω conditions.
Short-circuit input noise measurements are made using Figure 62.
The input-referred noise level is determined by dividing the
output noise by the numerical gain between Point A and Point B
and accounting for the noise floor of the spectrum analyzer.
The gain should be measured at each frequency of interest and
with low signal levels because a 50 Ω load is driven directly. The
generator is removed when noise measurements are made.
LMD
18nF
22pF
FERRITE
BEAD
120nH
IN
OUT
0.1µF
DUT
NETWORK ANALYZER
0.1µF
28Ω
237Ω
28Ω
1:1
50Ω
50Ω
270Ω
INH
237Ω
0.1µF
0.1µF
Figure 55. Gain and Bandwidth Measurements
LMD
18nF
22pF
IN
OUT
0.1µF
DUT
NETWORK ANALYZER
0.1µF
28Ω
237Ω
28Ω
1:1
50Ω
50Ω
INH
237Ω
0.1µF
0.1µF
10kΩ
10kΩ
FERRITE
BEAD
120nH
Figure 56. Frequency Response for Various Matched Source Impedances
LMD
22pF
IN
OUT
0.1µF
DUT
NETWORK ANALYZER
0.1µF
28Ω
237Ω
28Ω
1:1
50Ω
50Ω
0.1µF
INH
237Ω
0.1µF
FERRITE
BEAD
120nH
Figure 57. Frequency Response for Unterminated LNA, RS = 50 Ω



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