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AM29F017D 数据表(PDF) 28 Page - Advanced Micro Devices |
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AM29F017D 数据表(HTML) 28 Page - Advanced Micro Devices |
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28 / 41 page ![]() 26 Am29F017D 21195E5 September 12, 2006 DA TA SH EET AC CHARACTERISTICS Read-only Operations Notes: 1. Not 100% tested. 2. See Figure 8 and Table 11for test specifications. Parameter Symbol Parameter Description Test Setup Speed Options Unit JEDEC Std -70 -90 -120 -150 tAVAV tRC Read Cycle Time (Note 1) Min 70 90 120 150 ns tAVQV tACC Address to Output Delay CE# = VIL OE# = VIL Max 70 90 120 150 ns tELQV tCE Chip Enable to Output Delay OE# = VIL Max 70 90 120 150 ns tGLQV tOE Output Enable to Output Delay Max 40 40 50 55 ns tOEH Output Enable Hold Time (Note 1) Read Min 0000 ns Toggle and Data# Polling Min 10 101010 ns tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 20 20 30 35 ns tGHQZ tDF Output Enable to Output High Z (Note 1) Max 20 20 30 35 ns tAXQX tOH Output Hold Time From Addresses CE# or OE# Whichever Occurs First Min 0000 ns tReady RESET# Pin Low to Read Mode (Note 1) Max 20 202020 µs tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tOE 0 V RY/BY# RESET# tDF tOH Figure 9. Read Operation Timings |
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