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AM29BL802CB 数据表(PDF) 45 Page - Advanced Micro Devices

部件名 AM29BL802CB
功能描述  8 Megabit (512 K x 16-Bit) CMOS 3.0 Volt-only Burst Mode Flash Memory
PDF  46 Pages
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制造商  AMD [Advanced Micro Devices]
网页  http://www.amd.com
标志 AMD - Advanced Micro Devices

AM29BL802CB 数据表(HTML) 45 Page - Advanced Micro Devices

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November 3, 2006 22371C7
Am29BL802C
43
D A TA
SH EET
REVISION SUMMARY
Revision A (June 1, 1999)
Initial release.
Revision A+1 (June 25, 1999)
General Description
Corrected the device density in the first paragraph.
Command Definitions
Reading Array Data in Burst Mode: Added reference to
Figure 3 in the first paragraph.
Revision B (November 29, 1999)
Global
All speed options are now offered only at the regulated
voltage range of 3.0 to 3.6 V. The 90 and 120 speed
options now have a tOE of 26 ns at the industrial tem-
perature range. The 70 ns speed option is now avail-
able at the extended temperature range.
AC Characteristics
In Figures 17 and 18, deleted tGHWL; modified OE#
waveform.
Physical Dimensions
Updated drawing of SSOP to new version.
Revision C (June 20, 2000)
Global
The “advance information” data sheet designation has
been changed to “preliminary.” Only minor parameter
changes, if any, may occur. Speed, package, and tem-
perature range combinations may also change in future
data sheet revisions.
Distinctive Characteristics
Changed burst access time specification for the 65R
speed option in the industrial temperature range from
19 to 18 ns.
Product Selector Guide
Replaced tOE with tBACC to more clearly distinguish
burst mode access from asynchronous access times.
Note however, that in burst mode, tOE and tBACC spec-
ifications are identical. Changed tBACC for the 65R
speed option in the industrial temperature range from
19 to 18 ns.
Ordering Information
Burn-in processing is no longer available.
Requirements for Reading Array Data Array in
Asynchronous (Non-Burst) Mode
Clarified the description of how to terminate a burst
mode read operation.
Burst Mode Read with 40 MHz CLK figure
Changed tBACC for the 65R speed option in the indus-
trial temperature range from 19 to 18 ns.
Read Operations table
Changed tOE and tDF for the 65R speed option in the
industrial temperature range from 19 to 18 ns.
Burst Mode Read table
Changed tOE and tBACC for the 65R speed option in the
industrial temperature range from 19 to 18 ns.
Burst Mode Read figure
Corrected BAA# waveform to return high before the
final clock cycle shown.
Erase and Programming Performance table, Erase
and Program Operations table, Alternate CE# Con-
trolled Erase and Program Operations table
Resolved differences in typical sector erase times. The
typical sector erase time for all sectors is 3 sec.
Revision C+1 (November 16, 2000)
Global
Deleted Preliminary status from document. Added
table of contents. Added Figure 1, In-system Sector
Protect/Unprotect Algorithms figure to document (was
missing from previous revisions).
Revision C+2 (July 22, 2002)
Pin Description, IND# End of Burst Indicator
Clarified description of IND# function.
Table 1, Device Bus Operations
In burst read operations section, changed BAA# to “H”
for “Load star ting Burst Address” and Terminate
Current Burst Read Cycle; Start New Burst Read
Cycle.”
Requirements for Reading Array Data in Synchro-
nous (Burst) Mode
Modified section to clarify the description of the IND#
and burst read functions.
Burst Sequence Table
Deleted table.
Revision C+3 (November 22, 2002)
Distinctive Characteristics
Changed endurance to 1 million cycles.
Erase Sus p e n d / Eras e Res u me Comma nd
Sequence
Noted that only asynchronous reads are allowed during
the erase suspend mode, added asynchronous mode
and burst mode section.



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