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ams Datasheet

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[v1-00] 2016-Apr-12

T S L2 568 , T S L256 9 − Electrical Characteristics

Note(s):

1. Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible 640nm LEDs and infrared 940nm LEDs are used for final product testing for

compatibility with high-volume production.

2. The 640nm irradiance Ee is supplied by an AlInGaP light-emitting diode with the following characteristics: peak wavelength λp = 640nm and spectral halfwidth Δλ½ = 17nm.

3. The 940nm irradiance Ee is supplied by a GaAs light-emitting diode with the following characteristics: peak wavelength λp = 940nm and spectral halfwidth Δλ½ = 40nm.

4. Integration time Tint, is dependent on internal oscillator frequency (fosc) and on the integration field value in the Timing Register as described in the Register Set section. For nominal fosc = 735kHz,

nominal Tint = (number of clock cycles)/fosc.

Field value 00: Tint = (11 × 918)/fosc = 13.7ms

Field value 01: Tint = (81 × 918)/fosc = 101ms

Field value 10: Tint = (322 × 918)/fosc = 402ms

Scaling between integration times vary proportionally as follows: 11/322 = 0.034 (field value 00), 81/322 = 0.252 (field value 01), and 322/322 = 1 (field value 10).

ADC count value ratio:

Ch1/Ch0

Fluorescent light source:

Tint = 402ms

0.19

0.19

Incandescent light source:

Tint = 402ms

0.55

0.57

RV

Illuminance responsivity,

low gain mode (6)

Fluorescent light source:

Tint = 402ms

Ch0

11.6

11.1

counts/lux

Ch1

2.2

2.1

Incandescent light source:

Tint = 402ms

Ch0

37.5

33.8

Ch1

20.7

19.3

(Sensor Lux)/(actual Lux),

high gain mode (7)

Fluorescent light source:

Tint = 402ms

0.65

1

1.35

0.65

1

1.35

Incandescent light source:

Tint = 402ms

0.60

1

1.40

0.60

1

1.40

Symbol

Parameter

Test Conditions

Channel

TSL2568T,

TSL2569T

TSL2568CS,

TSL2569CS

Unit

Min

Typ

Max

Min

Typ

Max