33742S datasheet(7/65 Pages) FREESCALE

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Analog Integrated Circuit Device Data

Freescale Semiconductor

33742

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 4. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Rating

Symbol

Value

Unit

ELECTRICAL RATINGS

Power Supply Voltage at VSUP

Continuous (Steady-State)

Transient Voltage (Load Dump)

VSUP

-0.3 to 27

-0.3 to 40

Logic Signals

(RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and INT)

VLOG

-0.3 to VDD + 0.3

Output Voltage at VDD

VDD

0.0 to 5.3

Output Current at VDD

IDD

Internally Limited

Voltage

Output Current

VHS

IHS

-0.3 to VSUP + 0.3

Internally Limited

ESD Capability, Human Body Model (1)

HS, L0, L1, L2, L3, CANH, CANL pins

All Other pins

VESD1

±4000

±2000

ESD Capability, Machine Model (1)

VESD2

±200

Input Voltage/Current at L0, L1, L2, L3

DC Input Voltage

DC Input Current

Transient Input Voltage attached to external circuitry (2)

VDCIN

IDCIN

VTRINEC

-0.3 to 40

±2.0

±100

CANL and CANH

Continuous Voltage

Continuous Current

VCANH/L

ICANH/L

-27 to 40

200

CANH and CANL Transient Voltage (Load Dump) (3)

VLDH/L

CANH and CANL Transient Voltage (3)

VTRH/L

±40

Notes

Testing done in accordance with the Human Body Model (CZAP=100 pF, RZAP=1500 Ω), Machine Model (CZAP=200 pF, RZAP=0 Ω).

Testing done in accordance with ISO 7637-1. See Figure 5.

Load dump testing done in accordance with ISO 7637-1, Transient test done in accordance with ISO 7637-1. See Figure 6.

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