MAT01

Data Sheet

TEST CIRCUITS

Figure 11. Matching Measurement Circuit

Figure 12. Noise Measurement Circuit

+16.5V

50kΩ*

50kΩ*

TEST

UNITS

20kΩ

OP1177

100kΩ

1%

1MΩ

1MΩ*

100kΩ

1%

–15V

VOUT

S1B

S1A

S1A

S1B

VOS

VOUT1

CLOSED CLOSED

IOS

VOUT2 – VOUT1

1V PER mV

1V PER nA

OPEN

OPEN

100pF

MAT01

100pF

50kΩ*

V–

20µA

*MATCHED TO 0.01%

+16.5V

+15V

50kΩ*

50kΩ*

TEST

V01/√2

2.5MΩ

4kΩ

V02

3.3kΩ

LOW

FREQUENCY

NOISE

NOISE

DENSITY

4MΩ

4MΩ

100Ω

4.7µF

–15V

+15V

S1B

S2

S3

B

A

S1A

S1A

S1B

V01/(√2 × 4MΩ)

OPEN

OPEN

CLOSED

A

NOISE VOLTAGE DENSITY

(PER TRANSISTOR)

NOISE CURRENT DENSITY

(PER TRANSISTOR)

LOW FREQUENCY NOISE

(REFERRED TO INPUT)

CLOSED CLOSED CLOSED

A

OPEN

B

V02 PEAK-TO-PEAK

25,000

CLOSED CLOSED

2pF

MAT01

2pF

50kΩ*

–15V

20µA

720kΩ

*MATCHED TO 0.01%

S2

S3**

READING

V01

SPECTRUM

ANALYZER

OR

QUAN-TECH

IC NOISE

ANALYZER

2181/2283

**A AND B REFER TO THE THROW POSITION OF THE SWITCH

Rev. D | Page 8 of 12