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AD8027ARTZ-R2 数据表(PDF) 7 Page - Analog Devices

部件名 AD8027ARTZ-R2
功能描述  Low Distortion, High Speed Rail-to-Rail Input/Output Amplifiers
PDF  27 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

AD8027ARTZ-R2 数据表(HTML) 7 Page - Analog Devices

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Data Sheet
AD8027/AD8028
ABSOLUTE MAXIMUM RATINGS
analog.com
Rev. E | 7 of 27
Table 4.
Parameter
Rating
Supply Voltage
12.6 V
Power Dissipation
See Figure 3
Common-Mode Input Voltage
±VS ± 0.5 V
Differential Input Voltage
±1.8 V
Storage Temperature Range
−65°C to +125°C
Operating Temperature Range
−40°C to +125°C
Lead Temperature Range (Soldering 10 sec)
300°C
Junction Temperature
150°C
Stresses at or above those listed under Absolute Maximum Ratings
may cause permanent damage to the product. This is a stress
rating only; functional operation of the product at these or any other
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operat-
ing conditions for extended periods may affect product reliability.
MAXIMUM POWER DISSIPATION
The maximum safe power dissipation in the AD8027/AD8028 pack-
age is limited by the associated rise in junction temperature (TJ)
on the die. The plastic encapsulating the die locally reaches the
junction temperature. At approximately 150°C, which is the glass
transition temperature, the plastic changes its properties. Even tem-
porarily exceeding this temperature limit may change the stresses
that the package exerts on the die, permanently shifting the para-
metric performance of the AD8027/AD8028. Exceeding a junction
temperature of 175°C for an extended period of time can result in
changes in the silicon devices, potentially causing failure.
The still air thermal properties of the package and PCB (θJA),
ambient temperature (TA), and the total power dissipated in the
package (PD) determine the junction temperature of the die. The
junction temperature can be calculated as
TJ=TA+ PD×θJA
(1)
The power dissipated in the package (PD) is the sum of the quies-
cent power dissipation and the power dissipated in the package due
to the load drive for all outputs. The quiescent power is the voltage
between the supply pins (VS) times the quiescent current (IS).
Assuming the load (RL) is referenced to midsupply, the total drive
power is VS/2 × IOUT, some of which is dissipated in the package
and some in the load (VOUT × IOUT). The difference between the
total drive power and the load power is the drive power dissipated
in the package.
PD = Quiescent Power + (Total Drive Power − Load Power)
PD= VS×IS + VS2×VOUTRL −VOUT2RL (2)
It is recommended that rms output voltages be considered. If RL
is referenced to –VS, as in single-supply operation, the total drive
power is VS × IOUT.
If the rms signal levels are indeterminate, consider the worst case,
when VOUT = VS/4 for RL to midsupply.
PD= VS×IS + VS/42RL
(3)
In single-supply operation with RL referenced to –VS, worst case is
VOUT = VS/2.
Airflow increases heat dissipation, effectively reducing θJA. Also,
more metal directly in contact with the package leads from metal
traces, through holes, ground, and power planes reduces the θJA.
Care must be taken to minimize parasitic capacitances at the input
leads of high speed op amps, as described in the PCB Layout
section.
Figure 3 shows the maximum safe power dissipation in the package
vs. the ambient temperature for the 8-lead SOIC (125°C/W), 6-lead
SOT-23 (170°C/W), and 10-lead MSOP (130°C/W) packages on a
JEDEC standard 4-layer board.
OUTPUT SHORT CIRCUIT
Shorting the output to ground or drawing excessive current from the
AD8027/AD8028 can cause catastrophic failure.
Figure 3. Maximum Power Dissipation vs. Ambient Temperature
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Charged devi-
ces and circuit boards can discharge without detection. Although
this product features patented or proprietary protection circuitry,
damage may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.



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