TLE2072, TLE2072A, TLE2072Y

EXCALIBUR LOW-NOISE HIGH-SPEED

JFET-INPUT DUAL OPERATIONAL AMPLIFIERS

SLOS124A – JUNE 1993 – REVISED AUGUST 1994

5–19

POST OFFICE BOX 655303

PARAMETER MEASUREMENT INFORMATION

–

+

–

+

2 k

Ω

VCC +

VCC +

VO

VO

VCC –

VCC –

RS

RS

Ground Shield

Picoammeters

Figure 3. Noise-Voltage Test Circuit

Figure 4. Input-Bias and Offset-

Current Test Circuit

–

+

VCC +

VO

VCC –

IN –

IN +

Cic

Cic

Cid

Figure 5. Internal Input Capacitance

typical values

Typical values presented in this data sheet represent the median (50% point) of device parametric performance.

input bias and offset current

At the picoampere bias-current level typical of the TLE2072 and TLE2072A, accurate measurement of the bias

becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages can easily

exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments uses

a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but with

no device in the socket. The device is then inserted in the socket and a second test is performed that measures

both the socket leakage and the device input bias current. The two measurements are then subtracted

algebraically to determine the bias current of the device.

TYPICAL CHARACTERISTICS

Table of Graphs

FIGURE

VIO

Input offset voltage

Distribution

6

αVIO

Temperature coefficient

Distribution

7

IIO

Input offset current

vs Free-air temperature

8, 9

IIB

Input bias current

vs Free-air temperature

8, 9

IIB

Input bias current

p

vs Supply voltage

,

10

VICR

Common-mode input voltage range

vs Free-air temperature

11

VID

Differential input voltage

vs Output voltage

12, 13